The Paper's
Abstract of The 3rd
International Conference on Imaging Science and Hardcopy
A
Novel Quality Mapping Technology for Photoreceptors
May
26-29,1998
Chongqing China
Dr.
Ming-Kai Tse and Dr. John C. Briggs
Quality
Engineering Associates, Inc.Burlington, MA 01803 USA
Abstract:
Two critical factors
that affect print quality in electrophotography are coating uniformity and
the presence of coating defects in the photoreceptor.Therefore, in the design of photoreceptors, coating materials
must be optimized, and methods must be employed to ensure that the
photoconductive coating is highly uniform in thickness and
electrophotographic properties and is free from defects.A family of computerized photoconductor test systems providing a
novel electrostatic mapping method for uniformity and defects is now
commercially available.The
systems combine conventional measurements such as charge acceptance and
photosensitivity with the ability to detect and locate coating defects
below 100 microns in size.The
key to the success of this mapping method is the use of a mesurement
principle that closely resembles the basic electrophotographic process.Good correlations have been demonstrated between the test results
obtained and the image quality of actual prints.In this paper, the design methodology, operational characteristics,
system performance, and practical applications of these systems are
discussed.
中国复印科学与工程学会 Reprographic
Scientists and Engineers Society of China
7 Chang-Tu Rd.Tianjin300131,China Tel:(22)26669189 Fax: (22)26669189
E-mail: rsesc@public.tpt.tj.cn .
